Open AccessField and charge distribution at semicon/polyethylene interfaces from combinations of probe force microscopy measurements
Author(s) -
Francesco Gullo,
Thomas Christen,
Christina Villeneuve-Faure,
Henrik Hillborg,
Christian Laurent,
Séverine Le Roy,
G. Teyssèdre
Publication year - 2017
Publication title -
hal (le centre pour la communication scientifique directe)
Language(s) - English
Resource type - Conference proceedings
Subject(s) - kelvin probe force microscope , atomic force acoustic microscopy , materials science , nanoscopic scale , microscopy , conductive atomic force microscopy , polyethylene , photoconductive atomic force microscopy , surface finish , electrostatic force microscope , characterization (materials science) , atomic force microscopy , scanning probe microscopy , field (mathematics) , non contact atomic force microscopy , electric field , force field (fiction) , surface roughness , nanotechnology , composite material , scanning capacitance microscopy , magnetic force microscope , optics , physics , scanning electron microscope , scanning confocal electron microscopy , mathematics , pure mathematics , magnetization , quantum mechanics , magnetic field