Field and charge distribution at semicon/polyethylene interfaces from combinations of probe force microscopy measurements | Zendy

F. Gullo | Zendy; Thomas Christen | Zendy; Christina Villeneuve-Faure | Zendy; Henrik Hillborg | Zendy; C. Laurent | Zendy; Séverine Le Roy | Zendy; G. Teyssèdre | Zendy

Open Access

Field and charge distribution at semicon/polyethylene interfaces from combinations of probe force microscopy measurements

Author(s) -

F. Gullo,

Thomas Christen,

Christina Villeneuve-Faure,

Henrik Hillborg,

C. Laurent,

Séverine Le Roy,

G. Teyssèdre

Publication year - 2017

Publication title -

hal (le centre pour la communication scientifique directe)

Language(s) - English

Resource type - Conference proceedings

Subject(s) - kelvin probe force microscope , atomic force acoustic microscopy , materials science , nanoscopic scale , microscopy , conductive atomic force microscopy , polyethylene , photoconductive atomic force microscopy , surface finish , electrostatic force microscope , characterization (materials science) , atomic force microscopy , scanning probe microscopy , field (mathematics) , non contact atomic force microscopy , electric field , force field (fiction) , surface roughness , nanotechnology , composite material , scanning capacitance microscopy , magnetic force microscope , optics , physics , scanning electron microscope , scanning confocal electron microscopy , mathematics , pure mathematics , magnetization , quantum mechanics , magnetic field

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