Open AccessLow-frequency noise for different gate dielectrics on state-of-the-art UTBOX SOI nMOSFETs
Author(s) -
S. D. dos Santos,
Eddy Simoen,
V. Strobel,
B. Cretu,
JeanMarc Routoure,
R. Carin,
M. Aoulaiche,
A. Veloso,
M. Jurczak,
J. A. Martino,
Cor Claeys
Publication year - 2013
Publication title -
hal (le centre pour la communication scientifique directe)
Language(s) - English
Resource type - Conference proceedings
Subject(s) - silicon on insulator , optoelectronics , materials science , infrasound , dielectric , noise (video) , wafer , mosfet , silicon , electrical engineering , flicker noise , electronic engineering , computer science , cmos , physics , noise figure , engineering , acoustics , transistor , voltage , amplifier , artificial intelligence , image (mathematics)
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