Open AccessModelling the topology of radiation-induced damage at the cell population level.
Author(s) -
Yann Thibaut,
C. Villagrasa,
S. Incerti,
Y. Perrot
Publication year - 2021
Publication title -
hal (le centre pour la communication scientifique directe)
Language(s) - English
Resource type - Conference proceedings
Subject(s) - topology (electrical circuits) , computer science , population , engineering , electrical engineering , demography , sociology