Open AccessLow Frequency Noise Spectroscopy in Advanced nFinFETS
Author(s) -
Rachida Talmat,
H. Achour,
B. Cretu,
Jean-Marc Routoure,
A. Benfdila,
R. Carin,
N. Collaert,
A. Mercha,
E. Simoen,
Cor Claeys
Publication year - 2011
Publication title -
hal (le centre pour la communication scientifique directe)
Language(s) - English
Resource type - Conference proceedings
Subject(s) - materials science , infrasound , noise (video) , optoelectronics , silicon , transistor , dielectric , gate dielectric , fin , mosfet , spectroscopy , metal gate , electrical engineering , gate oxide , physics , acoustics , computer science , engineering , composite material , voltage , artificial intelligence , quantum mechanics , image (mathematics)
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