Open AccessCharacterization of the influence of different power supply styles on the electromagnetic emission of ICs by using the TEM-Cell method (IEC 61967-2)
Author(s) -
Timm Ostermann,
D. Schneider,
Christian Bächer,
Bernd Deutschmann,
R. Jungreithmair,
W. Gut,
Chr. K. Lackner,
R. Koessl,
R. Hagelauer
Publication year - 2002
Publication title -
hal (le centre pour la communication scientifique directe)
Language(s) - English
Resource type - Conference proceedings
Subject(s) - characterization (materials science) , power (physics) , materials science , electronic engineering , electrical engineering , engineering , physics , nanotechnology , quantum mechanics