Etude de la robustesse de transistors MOSFET SiC pour des applications aéronautiques | Zendy

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Etude de la robustesse de transistors MOSFET SiC pour des applications aéronautiques

Author(s) -

Dhouha Othman

Publication year - 2014

Publication title -

hal (le centre pour la communication scientifique directe)

Language(s) - French

Resource type - Conference proceedings

Subject(s) - physics , humanities , philosophy

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