Open AccessUsing Customer Usage Profiles to build Reliability Models from Warranty Data
Author(s) -
Adrien Pigeault,
Paul Toussaint,
Walid Ben,
Ghaya Hanmouda
Publication year - 2020
Publication title -
hal (le centre pour la communication scientifique directe)
Language(s) - English
Resource type - Conference proceedings
Subject(s) - warranty , computer science , reliability (semiconductor) , data modeling , reliability engineering , database , engineering , power (physics) , physics , quantum mechanics , political science , law
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