
Degradation of InGaN-based MQW photodetectors under 405 nm laser excitation
Author(s) -
Carlo De Santi,
Matteo Meneghini,
Alessandro Caria,
Ezgi Dogmus,
M. Zégaoui,
Farid Medjdoub,
Gaudenzio Meneghesso,
Enrico Zai
Publication year - 2017
Publication title -
hal (le centre pour la communication scientifique directe)
Language(s) - English
Resource type - Conference proceedings
Subject(s) - photodetector , materials science , optoelectronics , degradation (telecommunications) , laser , excitation , optics , computer science , electrical engineering , physics , telecommunications , engineering