Open AccessMultipactor sensitivity to Total Electron Emission Yield and TEEY models accuracy, studies made with a small gap waveguide structure.
Author(s) -
N. Fil,
Mohamed Belhaj,
J. Hillairet,
J. Puech
Publication year - 2017
Publication title -
hal (le centre pour la communication scientifique directe)
Language(s) - English
Resource type - Conference proceedings
Subject(s) - sensitivity (control systems) , electron , yield (engineering) , waveguide , materials science , optoelectronics , optics , physics , electronic engineering , engineering , nuclear physics , metallurgy