Open AccessReliability based optimization of a hat stiffened panel
Author(s) -
Oussama Braydi,
Pascal Lafon,
Rafic Younès,
Ahmad El Samrouta
Publication year - 2017
Publication title -
hal (le centre pour la communication scientifique directe)
Language(s) - English
Resource type - Conference proceedings
Subject(s) - reliability (semiconductor) , reliability engineering , computer science , structural engineering , engineering , physics , power (physics) , quantum mechanics