
Best Split-Half and Maximum Reliability
Author(s) -
Satyendra Nath
Publication year - 2013
Publication title -
iosr journal of research and method in education
Language(s) - English
Resource type - Journals
eISSN - 2320-7388
pISSN - 2320-737X
DOI - 10.9790/7388-0310108
Subject(s) - reliability (semiconductor) , statistics , reliability engineering , mathematics , engineering , physics , thermodynamics , power (physics)