Open AccessBio Inspired Fault Tolerance in VLSI Systems – A Survey
Author(s) -
C P Ancy
Publication year - 2014
Publication title -
iosr journal of vlsi and signal processing
Language(s) - English
Resource type - Journals
eISSN - 2319-4200
pISSN - 2319-4197
DOI - 10.9790/4200-04614751
Subject(s) - computer science , very large scale integration , fault tolerance , computer architecture , fault (geology) , reliability engineering , embedded system , distributed computing , engineering , seismology , geology
Accelerating Research
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom
Address
John Eccles HouseRobert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom