Open AccessLow Power and High Fault Coverage BIST TPG
Author(s) -
K. Vasudevareddy,
K. Venkata Ramanaiah,
K. Girija Sravani
Publication year - 2013
Publication title -
iosr journal of engineering
Language(s) - English
Resource type - Journals
eISSN - 2278-8719
pISSN - 2250-3021
DOI - 10.9790/3021-03511117
Subject(s) - computer science , fault (geology) , power (physics) , fault coverage , embedded system , reliability engineering , electrical engineering , seismology , geology , physics , engineering , electronic circuit , quantum mechanics