Open AccessFunctional Reliability Estimation of Pin Pullers Based on a Probit Model
Author(s) -
Byeong Min Mun,
Chinuk Lee,
Nam-Ho Kim,
Chang-Sun Choi,
Zaeill Kim,
Suk Joo Bae
Publication year - 2017
Publication title -
journal of the korea institute of military science and technology
Language(s) - English
Resource type - Journals
eISSN - 2636-0640
pISSN - 1598-9127
DOI - 10.9766/kimst.2017.20.2.225
Subject(s) - reliability (semiconductor) , reliability engineering , probit model , computer science , probit , estimation , simulation , engineering , machine learning , physics , power (physics) , systems engineering , quantum mechanics
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