Open AccessPredicting Silicon Die Breaking Force in Semiconductor Package Assembly through Mechanical Simulation
Author(s) -
Jefferson Talledo
Publication year - 2021
Publication title -
journal of engineering research and reports
Language(s) - English
Resource type - Journals
ISSN - 2582-2926
DOI - 10.9734/jerr/2021/v20i517307
Subject(s) - die (integrated circuit) , finite element method , structural engineering , bending , displacement (psychology) , fracture (geology) , semiconductor device , mechanical engineering , stress (linguistics) , silicon , span (engineering) , process (computing) , materials science , engineering , computer science , composite material , metallurgy , psychology , linguistics , philosophy , layer (electronics) , psychotherapist , operating system
Die crack is a common problem in the semiconductor industry and being able to predict the breaking force at a given loading condition could help prevent such crack problem. This paper presents the use of mechanical simulation in predicting the force at which the silicon die breaks in semiconductor package assembly process. A computer simulation with finite element analysis (FEA) technique was used. The applied force or displacement in a die bending simulation with 3 mm, 4 mm and 15 mm support span was varied until the resulting maximum principal stress of the die becomes equal to its fracture strength. Results revealed that the breaking force for the 70 µm die with 6 mm width is around 5 N for the 3 mm support span and only around 1 N for the 15 mm support span. With the good agreement between modeling and actual results, the study showed that mechanical simulation is an effective approach in predicting die breaking force and can be used to simulate different mechanical loads in the package assembly where possible die crack could happen and be avoided. This is a fast and cost-effective way of assessing risk of die crack and obtaining package assembly process parameters and specifications that are safe to the silicon die.