
Analysis of Twin in Mg Alloys Using Electron Backscatter Diffraction Technique
Author(s) -
Jong Youn Lee,
Dong-Won Kim,
Do Hyang Kim
Publication year - 2014
Publication title -
han-guk hyeonmigyeong hakoeji/applied microscopy
Language(s) - English
Resource type - Journals
eISSN - 2287-4445
pISSN - 2234-6198
DOI - 10.9729/am.2014.44.1.34
Subject(s) - electron backscatter diffraction , materials science , crystal twinning , stacking fault energy , texture (cosmology) , electron diffraction , diffraction , metallurgy , crystallography , microstructure , optics , artificial intelligence , chemistry , physics , computer science , image (mathematics)