Defect Detection algorithm of TFT-LCD Polarizing Film using the Probability Density Function based on Cluster Characteristic
Author(s) -
Eun-Hye Gu,
Kil-Houm Park
Publication year - 2016
Publication title -
journal of korea multimedia society
Language(s) - English
Resource type - Journals
eISSN - 2384-0102
pISSN - 1229-7771
DOI - 10.9717/kmms.2016.19.3.633
Subject(s) - histogram , pixel , skewness , liquid crystal display , artificial intelligence , probability density function , noise (video) , pattern recognition (psychology) , computer vision , cluster (spacecraft) , computer science , algorithm , function (biology) , image (mathematics) , mathematics , statistics , evolutionary biology , biology , programming language , operating system
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