Open AccessEPET-WL: Enhanced Prediction and Elapsed Time-based Wear Leveling Technique for NAND Flash Memory in Portable Devices
Author(s) -
Sung Ho Kim,
Jong Wook Kwak
Publication year - 2016
Publication title -
journal of the korea society of computer and information
Language(s) - English
Resource type - Journals
eISSN - 2383-9945
pISSN - 1598-849X
DOI - 10.9708/jksci.2016.21.5.001
Subject(s) - flash (photography) , nand gate , computer hardware , computer science , flash memory , embedded system , logic gate , physics , algorithm , optics
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