Open AccessEPET-WL: Enhanced Prediction and Elapsed Time-based Wear Leveling Technique for NAND Flash Memory in Portable Devices
Author(s) -
Sung Hoon Kim,
Jong Wook Kwak
Publication year - 2016
Publication title -
han-guk keompyuteo jeongbo hakoe nonmunji/han'gug keompyuteo jeongbo haghoe nonmunji
Language(s) - English
Resource type - Journals
eISSN - 2383-9945
pISSN - 1598-849X
DOI - 10.9708/jksci.2016.21.5.001
Subject(s) - flash (photography) , nand gate , computer hardware , computer science , flash memory , embedded system , logic gate , physics , algorithm , optics