Open AccessCharakterystyka AFM cienkich warstw SnO2 uzyskanych podczas sputteringu magnetronowego przy wybranych warunkach procesu
Author(s) -
T. Grudniewski,
Z. Lubańska,
Sławomir Czernik
Publication year - 2015
Publication title -
journal of civil engineering environment and architecture
Language(s) - Polish
Resource type - Journals
eISSN - 2300-8903
pISSN - 2300-5130
DOI - 10.7862/rb.2015.40
Subject(s) - atomic force microscopy , materials science , chemistry , business , nanotechnology
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