Open AccessSpectroscopic Ellipsometry Measurement and Modeling of Hydrogenated Amorphous Silicon
Author(s) -
KaHyun Kim
Publication year - 2019
Publication title -
han-guk taeyang eneoji hakoe nonmunjip/han'gug tae'yang e'neoji haghoe nonmunjib
Language(s) - English
Resource type - Journals
eISSN - 2508-3562
pISSN - 1598-6411
DOI - 10.7836/kses.2019.39.1.011
Subject(s) - ellipsometry , amorphous silicon , materials science , amorphous solid , dispersion (optics) , silicon , optics , polarization (electrochemistry) , analytical chemistry (journal) , crystalline silicon , optoelectronics , thin film , chemistry , nanotechnology , physics , crystallography , organic chemistry