Open AccessThermal Analysis of Silicon Carbide Coating on a Nickel based Superalloy Substrate and Thickness Measurement of Top Layers by Lock-in Infrared Thermography
Author(s) -
Ranjit Shrestha,
Wontae Kim
Publication year - 2017
Publication title -
journal of the korean society for nondestructive testing
Language(s) - English
Resource type - Journals
eISSN - 2287-402X
pISSN - 1225-7842
DOI - 10.7779/jksnt.2017.37.2.75
Subject(s) - materials science , superalloy , coating , thermography , substrate (aquarium) , silicon carbide , layer (electronics) , composite material , phase (matter) , silicon , infrared , optoelectronics , optics , microstructure , physics , oceanography , chemistry , organic chemistry , geology
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