Open AccessEvaluating Interfacial Adhesion Properties of Pt/Ti Thin-Film by Using Acousto-Optic Technique
Author(s) -
Haesung Park,
David Didie,
Sanichiro Yoshida,
Ik Keun Park
Publication year - 2016
Publication title -
journal of the korean society for nondestructive testing
Language(s) - English
Resource type - Journals
eISSN - 2287-402X
pISSN - 1225-7842
DOI - 10.7779/jksnt.2016.36.3.188
Subject(s) - materials science , thin film , interferometry , interference (communication) , optics , adhesion , michelson interferometer , transducer , optoelectronics , composite material , acoustics , nanotechnology , computer science , physics , computer network , channel (broadcasting)
Accelerating Research
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom
Address
John Eccles HouseRobert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom