Open AccessCharacterization of Probe Pin for LED Inspection System
Author(s) -
Hee-Soo Shim,
Sun Kyoung Kim
Publication year - 2015
Publication title -
journal of manufacturing engineering and technology/han-guk saengsan jejo siseutem hakoeji
Language(s) - English
Resource type - Journals
eISSN - 2383-4846
pISSN - 2233-6036
DOI - 10.7735/ksmte.2015.24.6.647
Subject(s) - materials science , homogeneity (statistics) , palladium , electrical contacts , nickel , plating (geology) , metallurgy , characterization (materials science) , indentation hardness , vickers hardness test , service life , electrode , composite material , microstructure , nanotechnology , computer science , chemistry , biochemistry , machine learning , geophysics , geology , catalysis