z-logo
open-access-imgOpen Access
Evaluation of deepfake detection using YOLO with local binary pattern histogram
Author(s) -
Štěpán Hubálovský,
Pavel Trojovský,
Nebojša Bačanin,
K. Venkatachalam
Publication year - 2022
Publication title -
peerj computer science
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.806
H-Index - 24
ISSN - 2376-5992
DOI - 10.7717/peerj-cs.1086
Subject(s) - histogram , computer science , artificial intelligence , local binary patterns , pattern recognition (psychology) , face (sociological concept) , feature (linguistics) , frame (networking) , image (mathematics) , binary number , computer vision , mathematics , telecommunications , social science , linguistics , philosophy , arithmetic , sociology

The content you want is available to Zendy users.

Already have an account? Click here to sign in.
Having issues? You can contact us here
Accelerating Research

Address

John Eccles House
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom