Open AccessCalculations of near-field emissions in frequency-domain into time-dependent data with arbitrary wave form transient perturbations
Author(s) -
Y. Liu,
Blaise Ravelo,
Jaleleddine Ben Hadj Slama
Publication year - 2012
Publication title -
advanced electromagnetics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.242
H-Index - 15
ISSN - 2119-0275
DOI - 10.7716/aem.v1i2.9
Subject(s) - fast fourier transform , transient (computer programming) , convolution (computer science) , time domain , physics , frequency domain , plane wave , fourier transform , computational physics , field (mathematics) , dipole , excitation , mathematical analysis , algorithm , acoustics , computer science , optics , mathematics , quantum mechanics , machine learning , artificial neural network , pure mathematics , computer vision , operating system
This paper is devoted on the application of the computational method for calculating the transient electromagnetic (EM) near-field (NF) radiated by electronic structures from the frequency-dependent data for the arbitrary wave form perturbations i(t). The method proposed is based on the fast Fourier transform (FFT). The different steps illustrating the principle of the method is described. It is composed of three successive steps: the synchronization of the input excitation spectrum I(f) and the given frequency data H0(f), the convolution of the two inputs data and then, the determination of the time-domain emissions H(t). The feasibility of the method is verified with standard EM 3D simulations. In addition to this method, an extraction technique of the time-dependent z-transversal EM NF component Xz(t) from the frequency-dependent x- and y- longitudinal components Hx(f) and Hy(f) is also presented. This technique is based on the conjugation of the plane wave spectrum (PWS) transform and FFT. The feasibility of the method is verified with a set of dipole radiations. The method introduced in this paper is particularly useful for the investigation of time-domain emissions for EMC applications by considering transient EM interferences (EMIs)