In-plane distribution of water inside Nafion® thin film analyzed by neutron reflectivity at temperature of 80 °C and relative humidity of 30%–80% based on 4-layered structural model
Author(s) -
Teppei Kawamoto,
Makoto Aoki,
Taro Kimura,
Takako Mizusawa,
Norifumi L. Yamada,
Junpei Miyake,
Kenji Miyatake,
Junji Inukai
Publication year - 2019
Publication title -
japanese journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.487
H-Index - 129
eISSN - 1347-4065
pISSN - 0021-4922
DOI - 10.7567/1347-4065/ab0c7c
Subject(s) - nafion , relative humidity , neutron reflectometry , electrolyte , materials science , substrate (aquarium) , polymer , layer (electronics) , humidity , reflectometry , analytical chemistry (journal) , neutron , composite material , chemistry , neutron scattering , chromatography , electrochemistry , electrode , thermodynamics , time domain , physics , oceanography , quantum mechanics , small angle neutron scattering , computer science , computer vision , geology
Structures of polymer electrolyte membranes and binders and the distribution of water inside are important for designing new ion-conductive ionomers for polymer electrolyte fuel cells. Neutron reflectometry (NR) was carried out on a Nafion ® film with a thickness of 100 nm formed on native SiO 2 surface on Si(100) for understanding the in-plane water distribution. The temperature was set at 80 °C and the relative humidity at 30, 50, 65, and 80% for NR measurements, simulating the conditions for the power generation. Clear NR modulation was obtained under each condition. NR data were fit very well with a 4-layer model parallel to the substrate with different densities of Nafion and water. At the interface between the Nafion film and the Si substrate, a 1 nm water-rich layer was observed under all conditions. The water concentration increased with humidity at all 4 layers, but the thickness increased mainly at the bulk layer.
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