Open AccessSparse Modeling of an Extended X-Ray Absorption Fine-Structure Spectrum Based on a Single-Scattering Formalism
Author(s) -
Ichiro Akai,
Kazunori Iwamitsu,
Yasuhiko Igarashi,
Masato Okada,
Hiroyuki Setoyama,
Toshihiro Okajima,
Yasuharu Hirai
Publication year - 2018
Publication title -
journal of the physical society of japan
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.76
H-Index - 139
eISSN - 1347-4073
pISSN - 0031-9015
DOI - 10.7566/jpsj.87.074003
Subject(s) - debye–waller factor , extended x ray absorption fine structure , scattering , computational physics , debye , fourier transform , physics , atom (system on chip) , materials science , structure factor , molecular physics , statistical physics , atomic physics , absorption spectroscopy , quantum mechanics , condensed matter physics , computer science , embedded system
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