Open AccessObservation of Structure of Surfaces and Interfaces by Synchrotron X-ray Diffraction: Atomic-Scale Imaging and Time-Resolved Measurements
Author(s) -
Yusuke Wakabayashi,
Tetsuroh Shirasawa,
Wolfgang Voegeli,
Toshio Takahashi
Publication year - 2018
Publication title -
journal of the physical society of japan
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.76
H-Index - 139
eISSN - 1347-4073
pISSN - 0031-9015
DOI - 10.7566/jpsj.87.061010
Subject(s) - materials science , synchrotron , diffractometer , diffraction , silicon , optics , semiconductor , synchrotron radiation , surface (topology) , surface reconstruction , optoelectronics , physics , scanning electron microscope , geometry , mathematics
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