Open AccessNanoscale Degradation Models for Semiconductor, Dielectric and Oxide Parts in the Devices Included in Functional Systems in NPP
Author(s) -
А. А. Popov
Publication year - 2020
Publication title -
engineering sciences
Language(s) - English
Resource type - Journals
eISSN - 2603-3542
pISSN - 1312-5702
DOI - 10.7546/engsci.lvii.20.03.01
Subject(s) - nanoscopic scale , degradation (telecommunications) , materials science , dielectric , semiconductor , nanotechnology , oxide , optoelectronics , engineering physics , computer science , engineering , telecommunications , metallurgy
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