Open AccessProgress of functionalized atomic force microscopy in the study of the properties of nanometric dielectric materials
Author(s) -
Meng Jingyi,
Lu Hong-Wei,
Ma Shile,
Jiaqi Zhang,
He Fumin,
Su Weitao,
Xiaodong Zhao,
Tian Ting,
Yi Wang,
Xing Yu
Publication year - 2022
Publication title -
acta physica sinica
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.199
H-Index - 47
ISSN - 1000-3290
DOI - 10.7498/aps.72.20221462
Subject(s) - kelvin probe force microscope , dielectric , materials science , conductive atomic force microscopy , microscopy , nanotechnology , electrostatic force microscope , photoconductive atomic force microscopy , miniaturization , nanoscopic scale , atomic force microscopy , optoelectronics , scanning capacitance microscopy , optics , composite material , scanning confocal electron microscopy , scanning electron microscope , physics
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