Open AccessEffect of annealing temperature on structure and stress properties of Ta<sub>2</sub>O<sub>5</sub>/SiO<sub>2</sub> multilayer reflective coatings
Author(s) -
刘保剑,
段微波,
李大琪,
余德明,
陈刚,
王天洪,
刘定权
Publication year - 2019
Publication title -
wuli xuebao
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.199
H-Index - 47
ISSN - 1000-3290
DOI - 10.7498/aps.68.20182247
Subject(s) - materials science , annealing (glass) , amorphous solid , surface roughness , dielectric , scanning electron microscope , analytical chemistry (journal) , optics , optoelectronics , composite material , crystallography , chemistry , physics , chromatography
In the optical system of spaceborne laser altimeter, dielectric mirror is an indispensable optical film element. Its surface shape quality directly affects the resolution and accuracy of distance measurement of the detection system. It is pressing and necessary to carry out research on the surface shape control technology of dielectric mirror to eliminate or reduce the effect of film stress on surface shape. The Ta 2 O 5 /SiO 2 multilayer reflective coatings are deposited on quartz substrates by using the ion beam assisted electron beam evaporation (IBE), and then annealed in air in a temperature range from 200 to 600 ℃. The effect of annealing temperature on the structure, optical and stress properties of Ta 2 O 5 /SiO 2 multilayer reflective coatings are systemically investigated by using x-ray diffraction, atomic force microscope, spectrophotometer and laser interferometer. The results show that all the Ta 2 O 5 /SiO 2 multilayer reflective coatings, after being annealed, are amorphous in structure. The annealing temperature has a great influence on the surface roughness of reflective coating. With the increase of annealing temperature, the surface roughness of reflective coating first decreases and then gradually increases, but is still smaller than that of as-deposited sample. After being annealed, the reflectance spectrum of reflective coating shifts slightly toward the long-wave direction, and the reflectivity increases a little. When being annealed at 500600 ℃, the compressive stress of reflective coating could be transformed into tensile stress, and the surface is changed from convex to concave shape. It can be concluded that annealing at an appropriate temperature can effectively release residual stress of Ta 2 O 5 /SiO 2 multilayer reflective coating and eliminate the deformation of substrate caused by film stress, and thus improving the surface shape quality of dielectric mirror., After being annealed, the reflective coating still possesses the stable structure and spectral properties, so that dielectric mirror can meet the application requirements of spaceborne laser altimeter. In this paper, the experimental results are of great significance for applying the annealing technology to the surface shape control technology of dielectric mirrors.