Open AccessStudy on the effect of X-ray diffractometer inherent angle scale error on the precision of lattice parameter calculation
Author(s) -
Xiaoming Xi,
Miao Wei,
Tao Kun
Publication year - 2014
Publication title -
wuli xuebao
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.199
H-Index - 47
ISSN - 1000-3290
DOI - 10.7498/aps.63.136001
Subject(s) - diffractometer , lattice (music) , lattice constant , diffraction , powder diffractometer , random error , materials science , scale (ratio) , computational physics , computer science , statistical physics , optics , physics , mathematics , statistics , quantum mechanics , acoustics , scanning electron microscope
This paper studies the effect of measuring angle error in X-ray powder diffractometer, which is caused by diffractometer inherent angle scale error resulting from mechanical manufacture, on the precision of calculated lattice parameter. It represents the theoretical limit of the consistency of the lattice parameters obtained by different diffractometers and laboratories. We use the calculated polysilicon diffraction patterns with random angle error to simulate the results measured by many sets of diffractometers of some manufacturing precision, then calculate and analyze the lattice parameters by three methods.