Open AccessAbnormal variation of optical properties of vanadium oxide thin film at semiconductor-metal transition
Author(s) -
Wu Yang,
Weifa Liang,
J Liu,
Yanda Ji
Publication year - 2014
Publication title -
wuli xuebao
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.199
H-Index - 47
ISSN - 1000-3290
DOI - 10.7498/aps.63.107104
Subject(s) - materials science , transmittance , refractive index , wavelength , molar absorptivity , semiconductor , vanadium oxide , optics , vanadium , reflection (computer programming) , thin film , transition metal , oxide , extinction (optical mineralogy) , metal , attenuation coefficient , optoelectronics , physics , nanotechnology , chemistry , metallurgy , catalysis , biochemistry , computer science , programming language
The optical properties of vanadium oxide thin film are measured at semiconductor-metal transition, including reflectance and transmittance results at different wavelengths which show different trends during the phase transition. With a multi-level reflection-transmission model of incoherent light, we calculate the values of refractive index n and extinction coefficient k at different wavelengths, and show that the abnormal optical properties result not only from the dependences of n and k on the wavelength, but also from multiple reflections in the absorbing film.