Abnormal variation of optical properties of vanadium oxide thin film at semiconductor-metal transition | Zendy

Yang Wei | Zendy; Liang Ji-Ran | Zendy; Jian Liu | Zendy; Ji Yang | Zendy

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Abnormal variation of optical properties of vanadium oxide thin film at semiconductor-metal transition

Author(s) -

Yang Wei,

Liang Ji-Ran,

Jian Liu,

Ji Yang

Publication year - 2014

Publication title -

acta physica sinica

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.199

H-Index - 47

ISSN - 1000-3290

DOI - 10.7498/aps.63.107104

Subject(s) - materials science , transmittance , refractive index , wavelength , molar absorptivity , semiconductor , vanadium oxide , optics , vanadium , reflection (computer programming) , thin film , transition metal , oxide , extinction (optical mineralogy) , metal , attenuation coefficient , optoelectronics , physics , nanotechnology , chemistry , metallurgy , catalysis , biochemistry , computer science , programming language

The optical properties of vanadium oxide thin film are measured at semiconductor-metal transition, including reflectance and transmittance results at different wavelengths which show different trends during the phase transition. With a multi-level reflection-transmission model of incoherent light, we calculate the values of refractive index n and extinction coefficient k at different wavelengths, and show that the abnormal optical properties result not only from the dependences of n and k on the wavelength, but also from multiple reflections in the absorbing film.

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