Open AccessHigh-temperature piezoelectirc thin films of 0.20BiInO3-0.80PbTiO3 deposited by pulsed laser deposition（Retracted Article)
Author(s) -
Wei Wang,
Tang Jia-Wei,
Wang Le-Tian,
Xiaobing Chen
Publication year - 2013
Publication title -
wuli xuebao
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.199
H-Index - 47
ISSN - 1000-3290
DOI - 10.7498/aps.62.237701
Subject(s) - materials science , pulsed laser deposition , dielectric , curie temperature , thin film , permittivity , analytical chemistry (journal) , piezoelectricity , coercivity , polarization (electrochemistry) , deposition (geology) , condensed matter physics , piezoelectric coefficient , nuclear magnetic resonance , composite material , optoelectronics , nanotechnology , chemistry , physics , ferromagnetism , paleontology , chromatography , sediment , biology
High-temperature piezoelectric thin films of 0.20BiInO3-0.80PbTiO3 (20BI-PT) were prepared via pulsed laser deposition and investigated by comparison with 0.15BiInO3-0.85PbTiO3(15BI-PT). XRD patterns show that (100) peak of 20BI-PT has been split, indicating a higher tetragnality than in 15BI-PT. FESEM images reveal some triangular grains corresponding to [111]-oriented grains in 20BI-PT. The remanent polarization (Pr) and coercive field (Ec) of 20BI-PT are 28 C/cm2 and 120 kV/cm, respectively. It is shown that the transverse piezoelectric coefficient e31, f keeps almost the same in 20BI-PT and 15BI-PT. The temperature dependence of dielectric permittivity in 20BI-PT reveals a higher Curie temperature (590 ℃) than that in 15BI-PT and no apparent frequency dependence is detected. Rayleigh analyses are performed to identify the extrinsic contributions to dielectric nonlinearity for different x. It is seen that x=0.15 exhibits greater extrinsic contributions to dielectric nonlinearity than the other compositions.