Interface effects on helium retention properties of ZrN/TaN nano-multilayers | Zendy

Wang Fei | Zendy; Liu Wang | Zendy; Deng Ai-Hong | Zendy; Zhu Jing-Jun | Zendy; Zhu An | Zendy; Yuan Wang | Zendy

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Interface effects on helium retention properties of ZrN/TaN nano-multilayers

Author(s) -

Wang Fei,

Liu Wang,

Deng Ai-Hong,

Zhu Jing-Jun,

Zhu An,

Yuan Wang

Publication year - 2013

Publication title -

acta physica sinica

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.199

H-Index - 47

ISSN - 1000-3290

DOI - 10.7498/aps.62.186801

Subject(s) - materials science , helium , nano , interface (matter) , condensed matter physics , atomic physics , composite material , physics , capillary number , capillary action

In this paper, ZrN/TaN nano-multilayers are fabricated in mixing atmosphere by radio frequency magnetron sputtering. The phase structures, He-related defects, helium content and cross-section morphologies of ZrN/TaN nano-multilayers are characterized by X-ray diffraction, slow positron beam analysis, enhanced proton backscattering spectrome and scanning electron microscope, respectively. The results show that the interface of ZrN/TaN nano-multilayer with 30 nm modulation period is stable and could resist the damage of helium even annealed at 600℃. The He retention rate of ZrN/TaN nano-multilayer with 30 nm modulation period can reach up to 45.6%.

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