Open AccessInterface effects on helium retention properties of ZrN/TaN nano-multilayers
Author(s) -
Wang Fei,
Liu Wang,
Anguo Deng,
Zhu Jing-Jun,
Zhongfu An,
Wei Yuan
Publication year - 2013
Publication title -
wuli xuebao
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.199
H-Index - 47
ISSN - 1000-3290
DOI - 10.7498/aps.62.186801
Subject(s) - materials science , helium , nano , interface (matter) , condensed matter physics , atomic physics , composite material , physics , capillary number , capillary action
In this paper, ZrN/TaN nano-multilayers are fabricated in mixing atmosphere by radio frequency magnetron sputtering. The phase structures, He-related defects, helium content and cross-section morphologies of ZrN/TaN nano-multilayers are characterized by X-ray diffraction, slow positron beam analysis, enhanced proton backscattering spectrome and scanning electron microscope, respectively. The results show that the interface of ZrN/TaN nano-multilayer with 30 nm modulation period is stable and could resist the damage of helium even annealed at 600℃. The He retention rate of ZrN/TaN nano-multilayer with 30 nm modulation period can reach up to 45.6%.