Open AccessCharacterization of elastic properties of a sample by atomic force microscope higher harmonic amplitude
Author(s) -
Zhang Wei-Ran,
Yingzi Li,
Xi Wang,
Wei Wang,
Jianqiang Qian
Publication year - 2013
Publication title -
wuli xuebao
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.199
H-Index - 47
ISSN - 1000-3290
DOI - 10.7498/aps.62.140704
Subject(s) - amplitude , cantilever , atomic force acoustic microscopy , harmonic , elastic modulus , non contact atomic force microscopy , materials science , optics , characterization (materials science) , scanning force microscopy , atomic force microscopy , resonance (particle physics) , kelvin probe force microscope , magnetic force microscope , condensed matter physics , physics , acoustics , nanotechnology , atomic physics , composite material , quantum mechanics , magnetization , magnetic field
When the atomic force microscope cantilever in tapping-mode is vibrated at a frequency close to its fundamental resonance frequency, the tip on its free end will be close to and away from the sample periodically. The higher harmonic signals produced by non-linear interactions between the tip and sample surface contain more nanomechanical information. We study the influence on the contact time by different elastic modulus and the relationship between higher harmonic amplitude and contact time. By theoretical analysis and calculation, we obtain the law of characterizing the sample surface elastic difference with the higher harmonic amplitude. Moreover, we obtain the experimental result consistent with the theory, on our homemade higher harmonic system.