
Study of quartz temperature characteristics for precise oscillator applications
Author(s) -
Huabing Zhu,
Zhengbin Wu,
Guoqiang Liu,
Xi Kui,
Li S,
Dong Yang-Yang
Publication year - 2013
Publication title -
wuli xuebao
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.199
H-Index - 47
ISSN - 1000-3290
DOI - 10.7498/aps.62.014205
Subject(s) - quartz , materials science , ranging , annealing (glass) , crystal oscillator , electrical impedance , characterization (materials science) , piezoelectricity , optoelectronics , simulated annealing , acoustics , temperature measurement , computational physics , computer science , composite material , nanotechnology , thermodynamics , physics , algorithm , telecommunications , resonator , quantum mechanics
In this paper, we report on the study of quartz material characteristic variation with temperature for precision oscillator applications with a novel piezoelectric material precise characterization method. Electrical impedance resonant characteristics of AT cut quartz sample are measured at temperatures ranging from ambient temperature up to 100 ℃. These measured results are fitted with a simulated annealing optimization algorithm to accurately calculate complex material parameters comprising loss characteristics. Effects of temperature change on quartz material characteristics and their loss are analyzed. This paper offers theoretical and technical supports to the design of precision oscillators with stable temperature characteristics.