
Study of KDP crystal lattice strain and stress by high resolution X-ray diffraction
Author(s) -
Sun Yun,
Shenglai Wang,
Qiang Gu,
Xu Xin-Guang,
Ding Jian-Xu,
Wenjie Liang,
Guangxia Liu,
Siming Zhu
Publication year - 2012
Publication title -
wuli xuebao
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.199
H-Index - 47
ISSN - 1000-3290
DOI - 10.7498/aps.61.210203
Subject(s) - materials science , diffraction , lattice (music) , crystal structure , crystal (programming language) , x ray crystallography , x ray , crystallography , cracking , cleave , stress (linguistics) , lattice constant , optics , condensed matter physics , composite material , nuclear magnetic resonance , physics , chemistry , computer science , programming language , acoustics , enzyme , linguistics , philosophy
The lattice strain of large-scale KDP crystal is characterized by using high resolution X-ray diffraction technique, and the lattice stress is analysed quantitatively in detail. The results indicate that KDP crystal may cleave easily along the [001] direction, which corresponds to the cracking phenomenon in the practical work. The major factors of introducing the internal stress and causing crack in the crystal growth process are summarized. Those conclusions provide important theoretical basis for proposing crack control measures of the large-scale KDP crystals.