Fabrication and characterization of single Nb/NbxSi1-x/Nb Josephson junction for voltage standard | Zendy

Wenhui Cao | Zendy; Jinjin Li | Zendy; Qing Zhong | Zendy; Guo Xiao-wei | Zendy; Qing He | Zendy; Zongtao Chi | Zendy

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Fabrication and characterization of single Nb/NbxSi1-x/Nb Josephson junction for voltage standard

Author(s) -

Wenhui Cao,

Jinjin Li,

Qing Zhong,

Guo Xiao-wei,

Qing He,

Zongtao Chi

Publication year - 2012

Publication title -

acta physica sinica

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.199

H-Index - 47

ISSN - 1000-3290

DOI - 10.7498/aps.61.170304

Subject(s) - josephson effect , materials science , pi josephson junction , niobium , fabrication , voltage , optoelectronics , superconductivity , condensed matter physics , etching (microfabrication) , superconducting tunnel junction , layer (electronics) , nanotechnology , physics , medicine , alternative medicine , pathology , metallurgy , quantum mechanics

The core device of Modern programmable Josephson voltage standard is Josephson junction array. The most advantageous Josephson junction array is Nb/NbxSi1-x/Nb material array. The advantages of Nb/NbxSi1-x/Nb material Josephson junction are that three-layer film production process is simple, Nb and NbxSi1-x etching processes are the same and NbxSi1-x potential barrier layer components can be easily adjusted. In this paper, we investigate the NbxSi1-x/Nb single Josephson junction in National Institute of Metrology. Through measuring the dc current-voltage characteristics under low temperature (4.2 K), superconducting tunneling current and a zero voltage state jumping to voltage state are observed clearly, finally the measurement results are discussed. The work is the first study on Nb/NbxSi1-x/Nb single Josephson junction in China.

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