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Investigation on strong optical activity and negative refractive index in double-layer metallic wires planar chiral structure
Author(s) -
Jie Li,
Yang Fang-Qing,
Jianfeng Dong
Publication year - 2011
Publication title -
acta physica sinica
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.199
H-Index - 47
ISSN - 1000-3290
DOI - 10.7498/aps.60.124202
Subject(s) - materials science , planar , refractive index , wavelength , metal , optics , rotation (mathematics) , polarization (electrochemistry) , dielectric , infrared , condensed matter physics , layer (electronics) , optoelectronics , physics , composite material , geometry , chemistry , computer graphics (images) , mathematics , computer science , metallurgy
A planar chiral structure composed of double-layer metallic wires with fourfold symmetry is proposed. The rotation angle and the dielectric layer thickness between double-layer metallic wires is optimized. The numerical simulation results show that the exceptionally strong polarization rotation and the large chiral parameter are found at the infrared wavelength, and show a negative refraction index in a certain band.

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