Open AccessReduction of 1/f noise in semiconductor devices based on wavelet transform and Wiener filter
Author(s) -
Deshuang Yu,
Jianxun Zhang
Publication year - 2011
Publication title -
wuli xuebao
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.199
H-Index - 47
ISSN - 1000-3290
DOI - 10.7498/aps.60.110516
Subject(s) - wiener filter , wavelet , second generation wavelet transform , wavelet transform , discrete wavelet transform , noise (video) , computer science , stationary wavelet transform , wavelet packet decomposition , filter (signal processing) , wiener deconvolution , algorithm , filter design , lifting scheme , mathematics , artificial intelligence , computer vision , deconvolution , blind deconvolution , image (mathematics)
In order to reduce universal 1/f noise in semiconductor devices, a method with combining lifting wavelet transform and Wiener filter is presented. Firstly, the iteratively reweighted least square method is introduced to fit the power spectrum of 1/f noise and estimate its parameter, and then an appropriate wavelet can be selected. Secondly, the signal with 1/f noise is decomposed by lifting wavelet transform. Considering the fact that the wavelet transform whitens 1/f noise, Wiener filter is used to treat the wavelet coefficient of each layer. Allpass filter is optimized to adjust the phase frequency response of Wiener filter, and the phase of filtered wavelet coefficient is not changed. Finally, the useful signal embedded in 1/f noise is retrieved by the inverse lifting wavelet transform. Experimental study demonstrates the proposed procedure and verifies its effectiveness, and the experimental data are acquired from a force sensor developed for minimally invasive surgery robot. The results show that the method works very well in minimizing 1/f noise, and so the resolution of the sensor increases 25%.