Open AccessDirect method of determining the lattice parameters of a phase from X-ray diffraction pattern of multi-phase
Author(s) -
Xiaoming Xi,
Miao Wei,
Tao Kun
Publication year - 2011
Publication title -
wuli xuebao
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.199
H-Index - 47
ISSN - 1000-3290
DOI - 10.7498/aps.60.086101
Subject(s) - extrapolation , diffraction , goniometer , lattice (music) , phase (matter) , lattice constant , optics , materials science , computer science , algorithm , computational physics , physics , mathematics , mathematical analysis , acoustics , quantum mechanics
A new method of determining lattice parameters by peak fitting of X-ray diffraction pattern, without involving structure parameters, is introduced. The method can be applied to a single phase and one phase in multi-phase diffraction patterns. It can avoid getting different fitting results caused by using different extrapolation functions, and can get a more accurate result in a short time. The application program of the method has been used in the practical work. For improving the fitting accuracy, the program can also adjust off-axis deviation of the sample surface and the goniometric mechanical zero.