Open AccessShot noise measurement methods in electronic devices
Author(s) -
WenHao Chen,
Lan Du,
Zhuang Yi-Qi,
Bao Jun-lin,
Liang He,
Hua Chen,
Peng Sun,
Tinglan Wang
Publication year - 2011
Publication title -
wuli xuebao
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.199
H-Index - 47
ISSN - 1000-3290
DOI - 10.7498/aps.60.050704
Subject(s) - shot noise , squid , electromagnetic shielding , noise (video) , interference (communication) , josephson effect , superconductivity , shot (pellet) , noise generator , preamplifier , physics , electromagnetic interference , optoelectronics , acoustics , optics , materials science , computer science , telecommunications , condensed matter physics , detector , noise figure , amplifier , quantum mechanics , channel (broadcasting) , cmos , artificial intelligence , image (mathematics) , ecology , biology , metallurgy
The limitations to shot noise measurement methods based on superconducting quantum interference device (SQUID) and superconductivity-insulation-superconductor (SIS) Josephson junction are pointed out, and a method to measure the shot noises of conventional electronic devices is proposed. Shot noise characteristics of conventional electronic devices are analyzed, and then a low-temperature measurement system is established. By using a double-shielding construction and low noise preamplifier, the test system can achieve a good electromagnetic interference shielding and low background noise. The theoretical and the experimental results of shot noises in diodes at 10 K are in good agreement with each other. The accuracy and the credibility of measurement system are proved.