Shot noise measurement methods in electronic devices | Zendy

Zhuang Yi-Qi | Zendy; Bao Jun-Lin | Zendy; Peng Sun | Zendy; Tinglan Wang | Zendy; Chen Wenhao | Zendy; Lei Du | Zendy; Liang He | Zendy; Hua Chen | Zendy

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Shot noise measurement methods in electronic devices

Author(s) -

Zhuang Yi-Qi,

Bao Jun-Lin,

Peng Sun,

Tinglan Wang,

Chen Wenhao,

Lei Du,

Liang He,

Hua Chen

Publication year - 2011

Publication title -

acta physica sinica

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.199

H-Index - 47

ISSN - 1000-3290

DOI - 10.7498/aps.60.050704

Subject(s) - shot noise , squid , electromagnetic shielding , noise (video) , interference (communication) , josephson effect , superconductivity , shot (pellet) , noise generator , preamplifier , physics , electromagnetic interference , optoelectronics , acoustics , optics , materials science , computer science , telecommunications , condensed matter physics , detector , noise figure , amplifier , quantum mechanics , channel (broadcasting) , cmos , artificial intelligence , image (mathematics) , ecology , biology , metallurgy

The limitations to shot noise measurement methods based on superconducting quantum interference device (SQUID) and superconductivity-insulation-superconductor (SIS) Josephson junction are pointed out, and a method to measure the shot noises of conventional electronic devices is proposed. Shot noise characteristics of conventional electronic devices are analyzed, and then a low-temperature measurement system is established. By using a double-shielding construction and low noise preamplifier, the test system can achieve a good electromagnetic interference shielding and low background noise. The theoretical and the experimental results of shot noises in diodes at 10 K are in good agreement with each other. The accuracy and the credibility of measurement system are proved.

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