Open AccessNumerical simulation of outgassing in the breakdown on dielectric surface irradiated by high power microwave
Author(s) -
Liang Cai,
Jianguo Wang
Publication year - 2011
Publication title -
wuli xuebao
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.199
H-Index - 47
ISSN - 1000-3290
DOI - 10.7498/aps.60.025217
Subject(s) - outgassing , materials science , dielectric , microwave , dielectric strength , irradiation , mechanics , computational physics , atomic physics , physics , optoelectronics , nuclear physics , quantum mechanics , astronomy
A simple outgassing model for dielectric surface breakdown due to the high power microwave (HPM) irradiation was establised. By using the PIC (particle-in-cell)-MCC(Monto Carlo collisions) method, the numerical simulation program of the dielectrics surface breakdown was developed, and the simulation of breakdown for different outgassing speeds was performed. The temporal evolution of the electron number and delay time of the process of breakdown in the case of different outgassing speeds were obtained. The numerical results show that when the speed of outgassing is small, the breakdown does not occur for an HPM pulse of a given duration, because the formation of the gas layer on the dielectric surface is slow. When the speed of outgassing is greater than a certain value, the breakdown occurs and the breakdown delay time shortens with the gas desorption rate increasing in a certain range. Finally, the numerical simulation results were compared with the experimental results of the direct current dielectric surface breakdown, and the trends of their development agree very well.