
Thickness dependence of the interfacial interaction for the Fe/ZnO (0001) system studied by photoemission
Author(s) -
Zhang Wang,
Xu Fa-Qiang,
Wang Guo-dong,
Wenhua Zhang,
Zongmu Li,
Liwu Wang,
Chen Tiexin
Publication year - 2011
Publication title -
wuli xuebao
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.199
H-Index - 47
ISSN - 1000-3290
DOI - 10.7498/aps.60.017104
Subject(s) - overlayer , x ray photoelectron spectroscopy , materials science , photoemission spectroscopy , synchrotron radiation , substrate (aquarium) , spectral line , deposition (geology) , analytical chemistry (journal) , condensed matter physics , nuclear magnetic resonance , chemistry , optics , physics , paleontology , oceanography , chromatography , astronomy , sediment , geology , biology
Synchrotron radiation photoemission spectroscopy (SRPES) and conventional X-ray photoelectron spectroscopy (XPS) were used to study the Fe/ZnO(0001 ) interface formation at room temperature. The interaction extent of Fe overlayer during the ZnO substrate was carefully monitored during the increase of Fe coverage, the results showed obvious Fe2+ formation at the initial stage of Fe deposition. Based on the photoemission spectra (PES) changes observed during the deposition of Fe on ZnO up to 3 nm, three meaningful and critical thicknesses have been observed which may be related to the surface charge transport, chemical reaction, and magnetic property, respectively. The new finding may be helpful to the design of related devices based on Fe/ZnO interface.