Open AccessPreparation of multiferroic of Bi0.85Nd0.15FeO3 thin films prepared by sol-gel method
Author(s) -
郭冬云,
李超,
王传彬,
沈强,
张联盟,
Tu Rong,
Takashi Goto
Publication year - 2010
Publication title -
wuli xuebao
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.199
H-Index - 47
ISSN - 1000-3290
DOI - 10.7498/aps.59.5772
Subject(s) - materials science , sol gel , dielectric , annealing (glass) , multiferroics , thin film , magnetization , dielectric loss , phase (matter) , impurity , analytical chemistry (journal) , ferroelectricity , composite material , nanotechnology , optoelectronics , magnetic field , chromatography , chemistry , physics , organic chemistry , quantum mechanics
The Bi0.85Nd0.15FeO3 thin films were prepared on the Pt/Ti/SiO2/Si substrates by Sol-gel method.The effect of annealing temperature on formation of Bi0.85Nd0.15FeO3 phase was investigated. It was found that the Bi0.85Nd0.15FeO3 phase was formed and coexisted with the impurity phase when the films annealed at 450 ℃. The single-phase Bi0.85Nd0.15FeO3 films were obtained,when they were annealed at 500—600 ℃. Bi0.85Nd0.15FeO3 films annealed at 600 ℃ had saturated magnetization about 44.8 emu/cm3, remnant polarization (2Pr) about 16.6 μC/cm2,dielectric constant 145 and dielectric loss 0.032(1 MHz), respectively.