Open AccessGrainboundary electronic structure of ZnO-Bi2O3 based varistor ceramics
Author(s) -
Pengfei Cheng,
Shengtao Li,
Jianying Li
Publication year - 2010
Publication title -
wuli xuebao
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.199
H-Index - 47
ISSN - 1000-3290
DOI - 10.7498/aps.59.560
Subject(s) - varistor , materials science , dielectric , ceramic , relaxation (psychology) , condensed matter physics , voltage , electronic engineering , analytical chemistry (journal) , optoelectronics , composite material , electrical engineering , chemistry , physics , psychology , social psychology , chromatography , engineering
Dielectric frequency spectra of ZnO-Bi2O3 based varistor ceramics were measured in the frequency range of 10-2Hz—106Hz from -100℃ to 20℃ by Novocontrol broadband dielectric spectrometer. The intrinsic defect structure of ZnO was calculated according to the theory which assumes that characteristics dielectric loss peaks of ZnO varistor ceramics origin from electronic relaxation process of intrinsic defects in depletion layer. At the same time the micro-electric parameters of grainboundary and the single grainboundary breakdown voltage Vb were obtained. The accordance of theory with experiment in Vb value indicates that the method to calculate grainboundary electronic structure by dielectric spectroscopy proposed in this paper is resonable.