Open AccessMicro-structure of growth solid-liquid boundary layer of KTa1-xNbxO3 crystal
Author(s) -
Qingli Zhang,
Shi Yin,
Jinglin You,
Yuanyuan Wang,
Weina Zhou,
Songming Wan
Publication year - 2010
Publication title -
wuli xuebao
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.199
H-Index - 47
ISSN - 1000-3290
DOI - 10.7498/aps.59.5085
Subject(s) - octahedron , materials science , crystallography , layer (electronics) , raman spectroscopy , crystal growth , crystal (programming language) , solid solution , crystal habit , crystal structure , chemistry , optics , nanotechnology , metallurgy , crystallization , organic chemistry , programming language , physics , computer science
Raman spectra of KTa1xNbxO3(KTN) single crystal,its melt, and the solid-liquid boundary layer in the growing process at different temperatures were measured in-situ. The structure transformation in KTN crystal growth process was investigated. The results showed that the [Ta/NbO3] entities came into solid-liquid boundary layer from KTN melt, and they were transformed to [Ta/NbO6] octahedron entities. And the structure of [Ta/NbO6] octahedron entity was just like that of KTN single cell. Regarding [Ta/NbO6] octahedron as growth units, the growth habit of KTN crystal in which the (100), (1-00), (010) and (01-0) faces are easily revealed was discussed. The thickness of the growth solid-liquid boundary layer of KTN crystal was about 80—90 μm.