Open AccessExperimental analysis of charge transfer efficiency degradation of charge coupled devices induced by proton irradiation
Author(s) -
Zujun Wang,
Tang Benqi,
Xiao Zhang,
Minbo Liu,
Shaoyan Huang,
Zhang Yong
Publication year - 2010
Publication title -
wuli xuebao
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.199
H-Index - 47
ISSN - 1000-3290
DOI - 10.7498/aps.59.4136
Subject(s) - irradiation , proton , degradation (telecommunications) , charge (physics) , materials science , radiation , radiation damage , atomic physics , molecular physics , nuclear physics , physics , electronic engineering , quantum mechanics , engineering
The experiments on charge coupled devices (CCD) irradiated by protons were carried out. The charge transfer efficiency (CTE) of CCD was measured before and after proton radiation. The radiation damage mechanism of CTE degradation was analyzed. The CTE degradation induced by irradiation of protons of different energies was compared. The experimental results were explained by the theoretical analysis based on the calculation by radiation particle transport simulation software.