Open AccessEffect of Ni thickness on the contact properties of Ni/6H-SiC analyzed by combinatorial method
Author(s) -
Wei Huang,
ZhiZhan Chen,
Yi Chen,
Shi Er-Wei,
Jingyu Zhang,
Liu Qingfeng,
Qian Liu
Publication year - 2010
Publication title -
acta physica sinica
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.199
H-Index - 47
ISSN - 1000-3290
DOI - 10.7498/aps.59.3466
Subject(s) - ohmic contact , materials science , schottky barrier , schottky diode , silicon carbide , nickel , analytical chemistry (journal) , nanotechnology , layer (electronics) , composite material , optoelectronics , metallurgy , chemistry , diode , chromatography
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